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In its eleventh year of experiments, Diamond is now operating with 31 beamlines and eight high-resolution electron microscopes. The next three years will see the final two Phase III beamlines complete construction and welcome first users. Of the electron microscopes, six are cryo-electron microscopes specialising in life sciences and make up eBIC (Electron Bio-Imaging Centre). The two remaining microscopes dedicated to advanced materials research are supplied by Johnson Matthey and the University of Oxford. These microscopes form ePSIC (Electron Physical Sciences Imaging Centre) and are operated under strategic collaboration agreements to provide for substantial dedicated peer reviewed user access. Both the eBIC and ePSIC centres are next to the Hard X-ray Nanoprobe beamline (I14). For academic research, Diamond instruments (beamlines and microscopes) are free at the point of access through peer-review. For proprietary research, access can be secured through Diamond’s industry team.
| Microscope | Main Capabilities | Accelerating Voltages | Operational Status |
|---|---|---|---|
| Titan Krios I | Cryo-EM, cryo-ET | 80, 120, 200, 300 kV | Operational since 2015 |
| Titan Krios II | Cryo-EM, cryo-ET | 80, 120, 200, 300 kV | Operational since 2016 |
| Titan Krios III | Cryo-EM, cryo-ET | 80, 120, 200, 300 kV | Operational since 2017 |
| Titan Krios IV | Cryo-EM, cryo-ET | 80, 120, 200, 300 kV | Operational since 2017 |
| Talos Arctica | Cryo-EM, cryo-ET | 200 kV | Operational since 2016 |
| Scios | Cryo-SEM, Cryo-FIB | 3 to 30 kV | Operational since 2017 |
| JEOL ARM200F | EDX, EELS, atomic scale STEM imaging, electron diffraction | 80, 200 kV | Operational since 2017 |
| JEOL ARM300F | EDX, atomic scale TEM and STEM imaging, electron diffraction | 30, 60, 80, 160, 200, 300 kV | Operational since 2017 |
| Beamline Name and Number | Main Techniques | Energy / Wavelength Range | Status |
|---|---|---|---|
| I02-1 - Versatile MX micro (VMXm) | Versatile macromolecular crystallography (VMX) | 10 - 25 keV | Construction |
| I02-2 - Versatile MX in situ (VMXi) | VMX | 10 - 25 keV | Commissioning |
| I03 - MX | Macromolecular crystallography (MX), Multiwavelength Anomalous Diffraction (MAD) | 5 - 25 keV | Operational |
| I04 - Microfocus MX | MX, MAD | 6 - 18 keV | Operational |
| I04-1 - Monochromatic MX | MX, XChem fragment screening | 13.53 keV (0.9163 Å - fixed wavelength) | Operational |
| I05 - ARPES | Angle-Resolved PhotoEmission Spectroscopy (ARPES) and nano-ARPES | 18 - 240 eV; 500 eV | Operational |
| I06 - Nanoscience | X-ray Absorption Spectroscopy (XAS), X-ray photoemission microscopy and X-ray magnetic circular and linear dichroism | 80eV - 2200eV | Operational |
| I07 - Surface and Interface Diffraction | Surface X-ray diffraction, Grazing Incidence X-ray Diffraction (GIXD), Grazing Incidence Small Angle X-ray Scattering (GISAXS), X-ray Reflectivity (XRR) | 6 - 30 keV | Operational |
| B07 - VERSOX: Versatile Soft X-ray | Spectroscopic and scanned-probe imaging | 50 - 2800 eV | Commissioning |
| I08 - Scanning X-ray Microscopy | Scanning X-ray microscopy | 250 eV - 4.2 keV | Operational |
| I09 - SISA: Surface and Interface Structural Analysis | XPS (including HAXPES), X-ray Standing Waves (XSW), Near Edge X-ray Absorption Fine Structure (NEXAFS), energy-scanned photoelectron diffraction | Hard X-rays: 2.1 - 18+ keV (currently 2.35 - 18+ keV) Soft X-rays: 0.1 - 2.1 keV (currently 0.1 - 1 keV) | Operational |
| I10 - BLADE: Beamline for Advanced Dichroism Experiments | Soft X-ray resonant scattering, XAS and X-ray magnetic circular and linear dichroism | Circular: 400-1600eV; Linear Horizontal: 250-1600eV; Linear Vertical: 480-1600eV | Operational |
| I11 - High Resolution Powder Diffraction | X-ray powder diffraction | 6 - 25(30) keV (0.5 - 2.1 Å) | Operational |
| DIAD: Dual Imaging and Diffraction | Simultaneous imaging and diffraction | 7 - 35 keV | Construction |
| I12 - JEEP: Joint Engineering, Environmental and Processing | Imaging and tomography (phase- and attenuation-contrast), single crystal diffraction, powder diffraction, energy dispersive diffraction, high-energy small angle scattering | 53 keV - 150 keV monochromatic or continuous white beam | Operational |
| I13 - X-ray Imaging and Coherence | Phase contrast imaging, tomography, full-field microscopy (under commissioning), coherent diffraction and imaging (CXRD,CDI), ptychography and photocorrelation spectroscopy (XPCS) (under commissioning), innovative microscopy and imaging | Imaging branch: 8 - 30keV | Operational |
| Coherence branch: 7 - 20keV | |||
| I14 - Hard X-ray Nanoprobe | Scanning X-ray fluorescence, X-ray spectroscopy, ptychography and transmission diffraction | 5 - 25 keV | Optimisation |
| I15 - Extreme Conditions | Powder diffraction, single crystal diffraction | 20 - 80 keV monochromatic focused minimum beam size restrictions for E> 30 keVWhite beam for special applications | Operational |
| I15-1 - X-ray Pair Distribution Function (XPDF) | X-ray Pair Distribution Function (XPDF) | 40, 65, and 76 keV | Optimisation |
| I16 - Materials and Magnetism | Resonant and magnetic single crystal diffraction | 3 - 15 keV | Operational |
| B16 - Test beamline | Diffraction, imaging, reflectometry | 4 - 20 keV monochromatic focused 4 - 45 keV monochromatic unfocused White beam | Operational |
| I18 - Microfocus Spectroscopy | Micro XAS, micro Extended X-ray Absorption Fine Structure (EXAFS), micro fluorescence tomography, micro XRD Reflection EXAFS (ReflEXAFS) | 2.05 - 20.5 keV | Operational |
| B18 - Core XAS | X-ray Absorption Spectroscopy (XAS) | 2.05 - 35 keV | Operational |
| I19 - Small-Molecule Single-Crystal Diffraction | Small-molecule single-crystal diffraction | 5 to 25 keV / 0.5 to 2.5 Å | Operational |
| I20 - LOLA: Versatile X-ray Spectroscopy | X-ray Absorption Spectroscopy (XAS), X-ray Emission Spectroscopy (XES) and Energy Dispersive EXAFS (EDE) | Dispersive branch: 6 - 26 keV | Commissioning |
| Scanning branch: 4 - 20 keV | Operational | ||
| I21 - Inelastic X-ray Scattering | Inelastic X-ray Scattering (IXS) | 250 - 3000 eV | Commissioning |
| B21 - High Throughput SAXS | Solution state small angle X-ray scattering | Currently 11-23 keV but set to 12.4 until variable camera installed | Operational |
| I22 - Small Angle Scattering and Diffraction | Small angle X-ray scattering and diffraction: SAXS, WAXS, ASAXS, USAXS, GISAXS. Micro-focus. | 3.5 - 20 keV | Operational |
| B22 - MIRIAM: Multimode InfraRed Imaging And Mircrospectroscopy | IR microspectroscopy and imaging, THz spectroscopy | Microscopy (μFTIR): 10,000-100 cm-1 (1-100 mm) Imaging (FPA): 5000-900 cm-1 (2-11 mm) Spectroscopy (FTIR): 10,000-10 cm-1(1.2 eV-1.2 meV) | Operational |
| I23 - Long Wavelength MX | Long wavelength macromolecular crystallography | 3 - 8 keV (1.5 - 4.1 Å) | Commissioning |
| B23 - Circular Dichroism | Circular dichroism | Module A: 125 - 500nm (for multiplates and films) Module B: 165 - 650nm (for solutions) | Operational |
| I24 - Microfocus MX | Macromolecular crystallography, MAD | 6.5 - 25.0 keV | Operational |
| B24 - Cryo Transmission X-ray Microscopy (TXM) | Full field X-ray imaging | 200eV - 2600eV | Optimisation |
Diamond Light Source is the UK's national synchrotron science facility, located at the Harwell Science and Innovation Campus in Oxfordshire.
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