Capabilities

ePSIC is equipped with two aberration corrected microscopes for studying materials at the atomic scale. The JEOL ARM300F is a double-corrected microscope dedicated to atomic scale imaging and 4D STEM studies. The JEOL ARM200F is a probe-corrected microscope that specializes in spectroscopic imaging with both EELS and EDX spectrometers.

• Ultra High Resolution TEM Cs corrected imaging at 300 kV, 200kV, 80 kV, 60kV, 30kV.
• Ultra High Resolution STEM Cs corrected imaging at 300 kV,200kV, 80 kV, 60kV, 30kV, in High-Angle Annular Dark-Field (HAADF), Low-Angle Annular Dark-Field (LAADF), Bright-Field (BF) and Annular Bright-Field (ABF) modes.
• Selected Area Electron Diffraction, Nanobeam Electron Diffraction and Convergent Beam Electron Diffraction.
• Gatan OneView Camera for fast TEM imaging and in-situ data capture.
• Merlin (MediPix) fast pixelated direct electron detector.
• Direct Electron DE16 fast pixelated direct electon detector.
• Oxford Instruments XMAX 100 EDX detector.

• High Resolution STEM Cs corrected imaging at 200kV and 80 kV, in High-Angle Annular Dark-Field (HAADF), Low-Angle Annular Dark-Field (LAADF), Bright-Field (BF) and Annular Bright-Field (ABF) modes.
• High Resolution secondary electron imaging at 200kV and 80kV.
• Selected Area Electron Diffraction, Nanobeam Electron Diffraction and Convergent Beam Electron Diffraction.
• Gatan OneView Camera for fast TEM imaging and in-situ data capture.
• Large solid angle dual EDX detectors (JEOL Centurio) for x-ray spectroscopy and mapping.
• Gatan Quantum Dual EELS spectrometer for electron energy loss spectroscopy and spectrum imaging.

 The following capabilities are shared across both microscopes:

• Anaerobic transfer with double tilt JEOL vacuum transfer holder .
• In-situ sample heating with single tilt DENS Solutions heating holder, temperature range: ambient to 1200 ºC.
• In-situ sample cooling with liquid nitrogen single tilt Fischione cooling holder, operating temperature -175 ºC.
• In-situ biasing with heating, cooling capability with single tilt HennyZ biasing holder.

Phase Focus Limited of Sheffield, UK has an international portfolio of patents and pending applications which relate to ptychography. A current list is available at www.phasefocus.com/patents. Diamond light source has a licence with Phase Focus which covers ptychographic experiments performed at ePSIC. For more information please contact a member of ePSIC staff. 

• Multi beam system consisting of an electron beam and gallium ion beam.
• Detectors; in-chamber ETD, in-column backscatter, backscatter topographical, backscatter compositional, in-column secondary.
• Slice and view imaging to give volumetric information.
• Ex-situ lift out system, for lifting out a lamella onto a TEM holder.