Principal Beamline Scientist:
Kejin Zhou
Tel: +44 (0) 1235 778296
E-mail: kejin.zhou@diamond.ac.uk
Email: sarnjeet.dhesi@diamond.ac.uk
Tel: +44 (0) 1235 778056
Detailed specification for sample preparation for the I21 beamline can be found below. For any additional questions or requirements, please contact the beamline team.
The I21 RIXS sample manipulator uses a Omnicron style sample puck as shown in the image below:
The dimensions of the puck can be found in the following drawing:
If the sample required for the experiment would have problems fitting in the described sample puck, please contact the beamline staff for guidance.
PODIUM SAMPLE HOLDER:
For half cutting x=0 mm for this sample holder without sample. The maximum thickness (sample height) is 3.5 mm for this sample holder.
FLAT SAMPLE HOLDER:
For this sample holder, the sample needs to be at least 2.4 mm tall and the maximum allowed height is 6 mm.
CARBON TAPE:
We strongly recommend to all users to add a piece of carbon tape when mounting their samples. This will ensure a smooth alignment of the spectrometer.
As the sample transfer is usually made at cold temperatures we also recommend to add some dots of silver paint to the corners of the carbon tape to ensure it does not fall during sample transfer.
Below is an sketch of an optimal way to place carbon tape in the sample holder to ensure it will remain accessible for all azimuthal angles.
The loadlock of I21's beamline has a cassette that allows for loading up to 5 samples in UHV prior to one experiment.
Samples can be cleaved in the loadlock at room temperature and UHV condition.
For experiments, sample pucks are transferred from the load lock to the sample manipulator. The cryocooled sample manipulator provides 6 degrees-of freedom (x, y, z, th, phi and chi). Routinely the base temperature of the sample is about 13 K, but with increasing liquid helium flow the temperature can be lowered to about 10 K. Total Electron Yield (TEY) measurements are available.
Axis |
Range |
Minimum Incremental Step |
Unidirectional Reproducibility |
x |
±5 mm |
< 5 µm |
0.5 µm |
y |
±5 mm |
< 5 µm |
0.5 µm |
z |
±50 mm |
< 1 µm |
0.5 µm |
th |
>345° |
<0.001° |
<0.001° |
phi |
±90° |
<0.01° |
<0.05° |
chi |
-30° to +45° |
<0.05° |
<0.05° |
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