Samuel Foster

As new techniques are developed, the smallest crystal dimension amenable to X-ray diffraction is decreasing, whilst the maximum dimension available to electron diffraction increases. Therefore, overlap exists between these techniques. Being based at both the micro/nanofocus X-ray beamline, VMXm and the MeV electron diffraction instrument, HeXI, I am interested in exploring what information can be determined from samples prepared for MX or ED (3DED/ microED), and where the similarities and differences lie. Radiation damage caused by X-ray sources is widely studied and largely predictable as a function of dose and sample composition. Due to the inherent differences in the radiation source, I am also interested to study radiation damage with electron diffraction.