XFEL-Hub Principal Scientist:
Allen Orville
Tel: +44 (0) 1235 567505
E-mail: allen.orville@diamond.ac.uk
Fixed target sample delivery is an efficent method to collect serial crrystallography at Synchrotrons and XFELs. I24 developed a fast xyz stage to collect serial data. If you are interested in using fixed target method during your own BAG beamtime, please check I24 SSX webpages.
Fixed Target data collection: from crystals to structure
Pipette chip loading for fixed target needs about 150 µL of crystal slurry with a density of about 106 - 107 crystals / mL. In order to reduce the amount of sample needed, we integrated the picolitre dispenser PolyPico with the same stages used on I24 to raster the chip at the beamline. We can can load a full chip with as little as 3-5 µL with a crystal density of 107 - 108 crystals / mL in about 6 min (Figure 1).
Figure 1 (from Davy et al., 2019). Experimental setup for (a) calibration of ejected droplets and (b) chip loading; in each, the directionof droplet ejection is shown in blue. (c) Schematic of chip loading from a similar viewpoint to (b)with translation stages hidden and the cartridge highlighted in yellow.
For more details please see our paper (Davy et al., J Synchrotron Radiat. 2019) and feel free to contact us.
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