Welcome to Structures and Surfaces
Obvious overlap in the science programmes will be developed, such as Angle Resolved PhotoElectron Spectroscopy (ARPES) on I05, B07 and I09, who have also been offering hard X-ray Photoelectron Spectroscopy (HAXPES) for studying bulk electronic structures. Beamlines I07 and B07 will strengthen the programme in areas of non-ultrahigh vacuum (non-UHV) studies including catalysis and electrochemistry. The new structure will also encourage cross group developments and we expect strong interactions with the Magnetic Materials Group, Spectroscopy beamlines and the Soft Condensed Matter Group in a number of science areas such as energy materials or catalysis. The grouping will enhance our ability to work more closely with user groups, offering a comprehensive range of techniques to non-specialists that will aid understanding of their science problems.
I05 ARPES
I05-ARPES is a facility dedicated to the study of electronic structures of solids and their surfaces by Angle-Resolved Photoemission Spectroscopy (ARPES). The ultra-high vacuum low temperature high resolution ARPES end station is served by an intense, highly monochromatic VUV to XUV photon beam from a variable polarisation Apple II undulator.
More informationEnergy: 18 - 240 eV
B07 VERSOX: Versatile Soft X-ray
B07 will be a highly versatile soft x-ray beamline for NEXAFS/XPS suitable for studies of heterogenous catalysis, pharmaceuticals & biomaterials under realistic conditions, electronic & photonic materials, atmospheric & space science on liquids/ices and heritage conservation.
More informationEnergy: 50 - 2800 eV
I07 Surface and Interface Diffraction
I07 is a high-resolution X-ray diffraction beamline for investigating the structure of surfaces and interfaces under different environmental conditions, including, for example, semiconductors and biological films.
More informationEnergy: 6 - 30 keV
I09 SISA: Surface and Interface Structural Analysis
I09 is designed to provide both soft and hard X-rays for high-resolution studies of atomic and electronic structures of surfaces and interfaces using photoelectron spectroscopy, near edge X-ray absorption fine structure, X-ray standing waves and photoelectron diffraction.
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