Welcome to Structures and Surfaces

The recent Science Division reorganisation has resulted in a rationalisation of the beamlines that were originally members of the Surfaces & Interfaces village. The new Structures and Surfaces Group consists of four beamlines, I05 (Angle Resolved Photoelectron Spectroscopy – ARPES), I07 (Surface and Interface X-ray Diffraction), B07 (Versatile Soft X-ray Scattering – VERSOX) and I09 (Surface and Interface Structural Analysis – SISA). There will be a much closer working relationship within this new structure, including more extensive internal collaborative research and improved offline facilities to serve the user community. The alignment has extended beyond just the science division and we are now able to work much more closely with engineering colleagues and software developers that are aligned with the new groups, leading to common solutions across the beamlines.

Obvious overlap in the science programmes will be developed, such as Angle Resolved PhotoElectron Spectroscopy (ARPES) on I05, B07 and I09, who have also been offering hard X-ray Photoelectron Spectroscopy (HAXPES) for studying bulk electronic structures. Beamlines I07 and B07 will strengthen the programme in areas of non-ultrahigh vacuum (non-UHV) studies including catalysis and electrochemistry. The new structure will also encourage cross group developments and we expect strong interactions with the Magnetic Materials Group, Spectroscopy beamlines and the Soft Condensed Matter Group in a number of science areas such as energy materials or catalysis. The grouping will enhance our ability to work more closely with user groups, offering a comprehensive range of techniques to non-specialists that will aid understanding of their science problems.
 

Science Group Leader

Cephise Cacho

Email: cephise.cacho@diamond.ac.uk
Tel: +44 (0)1235 778290

LaserPEEM/LEEM offline facility for surface preparation and characterisation

A new multidisciplinary nanoscience imaging facility, using PhotoEmission Electron Microscopy (PEEM) and Low-Energy Electron Microscopy (LEEM), is now available.

Find out more