This technique uses the Scios DualBeam Scanning Electron Microscope (SEM) and Focused Ion Beam (FIB) system to enable precision milling of frozen-hydrated samples. The primary use of this instrument will be to generate thin lamellae of cellular samples for cryo-electron tomography.
eBIC provides scientists with state-of-the-art experimental equipment and expertise in the field of cryo-electron microscopy, for both single particle analysis and cryo-tomography. Currently eBIC houses four Titan Krios microscopes, a Talos Arctica, an Aquilos cryo-FIB/SEM and a cryo-CLEM microscope.
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