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Industrial Liaison Group:
Tel: +44 (0) 1235 778797
E-mail: industry@diamond.ac.uk
The electron Physical Sciences Imaging Centre (ePSIC) located on the Harwell Campus in Oxfordshire is the result of a collaboration between Johnson Matthey, Oxford University and Diamond Light Source.
As part of Diamond’s pioneering hard X-ray nanoprobe beamline (I14) and electron microscopy centre, Johnson Matthey and Oxford University have contributed cutting-edge microscopes from JEOL to support research in the Physical Sciences. These microscopes are a unique JEOL 300kV electron microscope dedicated to atomic scale imaging at world-leading resolution (contricuted by Oxford University) and a world-leading JEOL double-EDX and EELS capable microscope dedicated to chemical analysis with atomic scale resolution (contributed by Johnson-Matthey).
This unique collaboration between Johnson Matthey, Oxford University and Diamond’s I14 beamline will facilitate the interchange of samples between these systems and enable analyses at near-duty catalytic conditions to observe the influence of chemical and thermal challenges on material structure.
The JEOL ARM200CF is an Atomic Resolution Analytical Electron Microscope, with a STEM Cs corrector providing a STEM-HAADF resolution of 78 pm and full analytical capabilities using EDX and EELS. The Cs corrected electron probe has an increased current density, one order larger than conventional FE TEMs enabling elemental analysis at the atomic-level.
The JEOL ARM200CF provides simultaneous STEM-ABF imaging for visualising light elements together with STEM-HAADF imaging.
Elemental EDX analysis and elemental mapping at atomic resolution is provided using twin JEOL Centurio wide area (100 mm2) Silicon Drift Detector (SDD) for high-speed and high-sensitivity detection.
The narrow energy spread that is characteristic of the cold FEG enables high energy resolution EELS analysis and fast EELS mapping with dual EELS capability.
Applications
Specification
[Resolution] | |
STEM ADF Mode | 78 pm (at 200kV, with cold FEG) |
TEM (point resolution) | 190 pm (at 200kV) |
[Magnification] | |
STEM | x 200 to x 150,000,000 |
TEM | x 50 to x 2,000,000 |
[Electron Source] | |
Emitter | W cold field |
Accelerating voltage | 200 to 80kV |
[Specimen System] | |
Stage | Eucentric Side Entry Goniometer stage Piezo X, Y, Z control |
Specimen size | 3 mmφ |
Maximum tilt angle | X axis: ±25° Y axis: ±25° |
Travel Range (mm) | X,Y: ±1, Z:±0.1 |
[Aberration Corrector] | |
Probe forming system Cs-corrector | Yes |
Image forming system Cs-corrector | No |
Additional Options | Double EDS 100mm2 high solid angle detectors Gatan Model 965 GIF Quantum ER Dual EELS Gatan one view Digital Camera Gatan Orius SC200D Digital Camera TEM/STEM Tomography acquisition Module Model 912 Tomography Holder Gatan 914 Cryo-Tomography holder |
The JEOL ARM300CF is an Atomic Resolution Electron Microscope, with both STEM and TEM Cs correctors providing a STEM-HAADF resolution of 47 pm and a TEM resolution of 50pm.
It is optimised for imaging over arrange of accelerating voltages from 60 – 300kV and is fitted with a range of detectors for different imaging modes. Heating a cooling specimen holders are available.
The JEOLARM300CF provides simultaneous STEM-ABF imaging for visualising light elements together with STEM-HAADF imaging using one of several detectors together with TEM imaging using either a direct electron detector or a fast coupled CMOS camera.
Applications
[Resolution] | |
STEM ADF Mode | 47 pm (at 300kV, with cold FEG) |
TEM (point resolution) | 50 pm (at 300kV) |
[Magnification] | |
STEM | x 200 to x 250,000,000 |
TEM | x 50 to x 4,000,000 |
[Electron Source] | |
Emitter | W cold field |
Accelerating voltage | 300, 200, 100, 80 and 60kV |
[Specimen system] | |
Stage | Eucentric Side Entry Goniometer stage Piezo X,Y,Z control |
Specimen size | 3 mm |
Maximum tilt angle | X axis: ±25° Y axis: ±25° |
Travel Range (mm) | X,Y: ±1, Z:±0.1 |
[Aberration Corrector] | |
Probe forming system Cs-corrector | Yes (ETA Type) |
Image forming system Cs-corrector | Yes (ETA Type) |
Additional Options | Gatan one view Digital Camera Multiple STEM detectors High resolution Direct detection TEM Camera |
Diamond Light Source is the UK's national synchrotron science facility, located at the Harwell Science and Innovation Campus in Oxfordshire.
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Harwell Science & Innovation Campus
Didcot
Oxfordshire
OX11 0DE
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