The Scanning X-ray Microscopy (SXM) beamline (I08) is dedicated to the morphological, elemental, and chemical speciation of a broad range of organic and inorganic specimens. It operates within a photon energy range of 250-4400 eV and supports sample investigations under both ambient and cryogenic conditions.
Benefits:
- Dedicated to X-ray absorption and phase-sensitive imaging and spectroscopies in real and reciprocal space.
- Provides elemental mapping using low-energy X-ray fluorescence (LEXRF) and chemical analysis through X-ray near-edge absorption spectroscopy (XANES), achieving a nanoscale spatial resolution of 20 nm.
- Can be combined with complementary imaging and spectroscopic techniques.
- Produces high quality spectroscopic data for chemically-sensitive analysis and X-ray fluorescence mapping (XRF) when operating at the upper end of the photon energy range.
Best For:
- Nanoscale elemental distribution in biological samples
- Nanoparticles in materials
- Chemical processes at the nanoscopic scale, applied in the fields of batteries, fuel cells, and catalysis
- Metal interactions in metal-containment soils
- Magnetic properties of various materials.