Versatile Soft X-ray (VERSOX)

A common feature to all studies using VERSOX is an interest in the chemical nature and composition of the near-surface regions of the samples, which are characterised using soft X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (NEXAFS/XANES). They also do not need extreme energy resolution or photon flux (in fact, many of the samples are extremely beam-sensitive), however they require non-standard sample environments and detection techniques, which are not usually found or possible at standard soft X-ray beamlines of 3^rd generation synchrotron sources.