XRF Beamlines

The microfocus spectroscopy beamline, I18, uses 2 x 2 µm² beam to examine heterogeneous materials on the micrometre scale using a variety of techniques, such as  XRF,  XANES  and  XRD.

Benefits:

• Allows structural investigations of complex systems
• Provides special resolution of down to 2 microns 
• Enables investigations of materials in hostile environments
• Dedicated optics for µ-focus allows the mapping of elements in complex samples
• Enables combined experiments, such as XRF tomography, XAS-CT, XRD-CT, XAS/XRF, XRD/XRF

Best For:

• Complex samples and challenging conditions/hostile environments
• Real systems, such as mineral samples returned from space
• Anti-cancer drug candidates for tumours

The  Scanning X-ray Microscopy (SXM)  beamline (I08) is dedicated to morphological, elemental and chemical speciation on a broad range of organic-inorganic specimens in a 250-4400 eV photon energy range, and sample investigations under ambient or cryogenic conditions.

Benefits:

• Dedicated to  X-ray absorption  and phase-sensitive imaging and spectroscopies in real and reciprocal space.
• Covers elemental mapping at low-energy X-ray flurorescence (LEXRF) and chemical analysis by X-ray near-edge absorption spectroscopy (XANES)
• Can be combined with complementary imaging and spectroscopic techniques.
• Produces high quality spectroscopic data for chemically-sensitive analysis and X-ray fluorescence mapping (XRF) when operating at the upper end of the photon energy range. 

Best For:

• Nanoscale elemental distribution in biological samples
• Nanoparticles in materials
• Chemical processes at the nanoscopic scale applied in the fields of batteries, fuel cells and catalysis
• Metal interactions in metal-containment soils

I14, the Hard X-ray Nanoprobe beamline, offers a small beam of 50 nm for high-resolution imaging with a wide energy range (5-23 keV). The beamline has developed and expanded its capabilities in  X-ray fluorescence,  diffraction  and  XANES mapping. Raster scanning capability combined with simple data acquisition software is suitable for fast acquisition and increased sample area coverage.

Benefits:

• Provides the ability to obtain structural and chemically-specific information on a full range of materials (inorganic/organic)
• Enables samples to be studied under both static and real (e.g. wet, heated, in situ strain) conditions. 
• Provide a flexible end station, with a beam size of 50 nm, optimised for scanning  X-ray fluorescence,  X-ray spectroscopy  and  diffraction

Best For:

• Corroded metal interfaces
• Metallic particles in cells
• Catalysis under in situ conditions
• Photovoltaic films

The core EXAFS beamline, B18, is characterised by a wide energy range, a focused beam and a continuous scanning monochromator. These characteristics allow for the efficient collection of XAS data on all elements heavier than phosphorus.

The recent implementation of a fluorescence mapping tool with the spatial resolution of down to 200x200 microns  has enabled new experiments to be performed on the beamline.

Benefits:

• Wide energy range (2-35 keV)
• Quick EXAFS mode enabling single XAS spectrum to be collected in a few seconds to a few minutes
• Provides access to all elements ranging from phosphorous and sulphur up to the actinides
• Enables combined set-ups of XAS/XRD, XAS/DRIFTS, XAS/Raman, XAS/UV-Vis
• Enables time-resolved and in situ conditions
• Flexible to accommodate various sample environments

Best For:

• Heterogeneous systems
• Corrosion mechanisms
• Novel materials for renewable energy storage
• New battery materials under different operating conditions