XRF Beamlines

The microfocus spectroscopy beamline, I18, uses 2 x 2 µm² beam to examine heterogeneous materials on the micrometre scale using a variety of techniques, such as XRF, XANES and XRD.

Benefits:

• Allows structural investigations of complex systems
• Provides special resolution of down to 2 microns 
• Enables investigations of materials in hostile environments
• Dedicated optics for µ-focus allows the mapping of elements in complex samples
• Enables combined experiments, such as XRF tomography, XAS-CT, XRD-CT, XAS/XRF, XRD/XRF

Best for: 

• Complex samples and challenging conditions/hostile environments.
• Real systems such as mineral samples returned from space
• Anti-cancer drug candidates with tumours

Further details on I18

Sample environments for I18

The Scanning X-ray Microscopy (SXM) beamline (I08) is dedicated to morphological, elemental and chemical speciation on a broad range of organic-inorganic specimens in a 250-4400 eV photon energy range, and sample investigations under ambient or cryogenic conditions.
 

Benefits:

• Dedicated to X-ray absorption and phase-sensitive imaging and spectroscopies in real and reciprocal space.
• Covers elemental mapping as low-energy X-ray flurorescence (LEXRF) and chemical analysis by X-ray near-edge absorption spectroscopy (XANES)
• Can be combined with complementary imaging and spectroscopic techniques.
• Produces high quality spectroscopic data for chemically-sensitive analysis and X-ray fluorescence mapping (XRF) when operating at the upper end of the photon energy range. 

Best for:

• Nanoscale elemental distribution in biological samples
• Nanoparticles in materials
• Chemical processes at the nanoscopic scale applied in the fields of batteries, fuel cells and catalysis
• Metal interactions in metal-containment soils

Further details on I08

Sample environments for I08

I14, the Hard X-ray Nanoprobe beamline, offers a small beam of 50 nm for high-resolution imaging with a wide energy range (5-23 keV). The beamline has developed and expanded its capabilities in X-ray fluorescence, diffraction and XANES mapping. Raster scanning capability combined with simple data acquisition software is suitable for fast acquisition and increased sample area coverage.

Benefits:

• Provides the ability to obtain structural and chemically-specific information on a full range of materials (inorganic/organic)
• Enables samples to be studied under both static and real (e.g. wet, heated, in-situ strain) conditions. 
• Provide a flexible endstation, with a beam size of 50 nm, optimised for scanning X-ray fluorescence, X-ray spectroscopy and diffraction

Best for:

• Corroded metal interfaces
• Metallic particles in cells
• Catalysis under in situ conditions
• Photovoltaic films

Further details on I14

The core EXAFS beamline, B18, is characterised by a wide energy range, a focused beam and a continuous scanning monochromator.  These characteristics allow for efficient collection of XAS data on all elements heavier than phosphorus.

The recent implementation of a fluorescence mapping tool has enabled new experiments to be performed on the beamline.

Benefits:

• Wide energy range (2-35 keV)
• Quick EXAFS mode enabling single XAS spectrum to be collected in a few seconds to a few minutes
• Provides access to all elements ranging from phosphorous and sulphur up to the actinides
• Enables a combined set-ups of XAS/XRD, XAS/DRIFTS, XAS/Raman, XAS/UV-Vis
• Enables time-resolved and in situ conditions
• Flexible to accommodate various sample environments

Best for: 

• Heterogeneous systems
• Corrosion mechanisms
• Novel materials for renewable energy storage
• New battery materials under different operating conditions
   

Further details on B18

Sample environments for B18