Whyuse

Why choose X-ray Photoelectron Spectroscopy (XPS) at Diamond for your research?

At Diamond, we offer tailored services designed specifically for industry, enabling streamlined access to world-class analytical capabilities. Our X-ray Photoelectron Spectroscopy (XPS) facilities provide unparalleled advantages for surface analysis across a wide range of materials, supporting innovation and performance enhancement in industrial applications.

Through our advanced facilities, users gain detailed quantitative and chemical state information from material surfaces, critical for understanding and improving properties such as corrosion resistance, catalytic activity, adhesive strength, wettability, contact potential, and failure mechanisms.

Diamond’s dedicated XPS beamlines support in situ investigations at ambient pressures, allowing real-time monitoring of changes within a controlled environment. This is further enhanced by Diamond’s unique set-up, offering seamless integration with complementary techniques. Furthermore, our well-equipped off-line laboratories support sample preparation and surface characterisation, providing optimal conditions for experiments.

Throughout the process, Diamond’s expert scientists provide hands-on support, helping researchers maximise the value of their beamtime and accelerate development cycles. By leveraging our state-of-the-art XPS capabilities, industrial partners can achieve deeper insights and drive significant advancements in material performance.

Benefits-Diamond

Benefits of using XPS at Diamond

  • Support and guidance: From our dedicated Spectroscopy experts
  • High intensity and tunable energy: Enables you to deploy selected energies for depth-dependent chemical analysis, such as cross-section and absorption edge studies, enhancing your material analysis.
  • Near ambient pressure: Provides the ability to operate at pressures higher than
    7 mbar, allowing you to investigate surfaces in equilibrium with water vapour or other conditions relevant to industrial applications.
  • Simultaneous use of soft and hard X-rays: Facilitates comprehensive analysis by enabling the use of both soft and hard X-rays at the same time.
  • High throughput and shorter data acquisition times: Allows you to work on multiple samples efficiently in an ultra-high vacuum, saving you time and increasing productivity.
  • In situ capabilities: Facilitates the study of chemical processes under conditions that mimic industrial environments, such as the presence of water vapour, various gases, and different temperatures.
  • Broad elemental analysis: Allows you to analyse a range of elements across one spectrum, providing a comprehensive understanding of your material.
  • High resolution data: Enables you to focus on specific areas of interest with high-resolution data once initial results are received and analysed, ensuring detailed and accurate insights.
  • Advanced PEEM beamline: Our X-ray photoemission electron microscopy (PEEM) beamline provides information on the morphology, electronic properties, and magnetic state of materials at the nanoscale.

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