XPS Beamlines

This Nanoscience beamline exploits the brightest region in Diamond’s spectrum, providing a high-photon flux density for soft X-ray experiments. It combines microfocused soft X-rays with variable linear and circular polarisation and X-ray photoelectron emission microscopy (PEEM) to provide spectroscopic data on nanometre length scales. The intense polarised beam can be focused to a spot several microns in diameter, allowing the study of nanomagnetism and nanostructures.

Benefits:

• Enables the study of nanomagnetism and nanostructures
• Allows the study of light elements such as carbon, oxygen, nitrogen and sulphur present in the specimen
• Enables L-edge XANES studies of heavier elements
• Capable of collecting element specific data at high spatial resolution (~20nm) 
   

Best For:

• The structure-function relationship of nanostructures
• The electronic properties and chemical species of complex materials
• Composition of challenging materials

B07 is a Versatile Soft X-ray (VERSOX) beamline with near ambient pressure XPS/NEXAFS (near edge X-ray absorption fine structure) capabilities. The beamline covers a wide range of non-vacuum sample environments and enables high-throughput XPS measurements on multiple samples and in situ NEXAFS studies at up to 1 bar pressure.

Benefits:

• It enables the chemical nature and composition of the near-surface regions of samples, which are to be characterised using soft X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS).
• Suitable for samples that do not need extreme energy resolution or photon flux but may require non-standard sample environments and detection techniques
• Capable of performing XPS (up to 100 mbar) and NEXAFS experiments under near-ambient pressures (up to 1 bar)
   

Best For:

• Heterogeneous catalysts
• Pharmaceuticals and biomaterials under realistic conditions
• Environmental and space science studies on liquids and ices
• Heritage conservation
• Electronic and photonic materials.

I09 is designed to provide both soft and hard X-rays for high-resolution studies of atomic and electronic structures of surfaces and interfaces. It utilises techniques such as photoelectron spectroscopy, near edge X-ray absorption fine structure, X-ray standing waves, and photoelectron diffraction.

Benefits:

• Allows different techniques to be applied to the same sample, producing hard and soft X-rays simultaneously
• Offers a wide photon energy range (230 eV - 18 keV)
• Provides depth-dependent chemical analyses (cross section and absorption edge) using angle-resolved mode
• Allows a quick data acquisition time
   

Best For:

• Complex surface investigations
• Probing electronic structures of buried layers and interfaces
• Investigations into the doping interactions in electrolyte materials
• Characterisation of heteroepitaxial growth in metals, semiconductors, functional alloys, and metal oxides